Сообщение от
Denisius
В бытовых применениях только WD умудряется "держать марку".
В "про" тоже.
Сообщение от
Denisius
Тошиба давно не конкурент.
Нам тошибу из другого города возят раз в неделю. Тож 2 Тб. Вот уже полгода как путешествует. Вроде ниче, но смарт мне не нравиться:
Код:
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA DT01ACA200
Serial Number: Y3QU02RKS
Firmware Version: MX4OABB0
User Capacity: 2,000,398,934,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Thu Sep 1 23:25:35 2016 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (14248) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 238) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 68
3 Spin_Up_Time 0x0007 127 127 024 Pre-fail Always - 297 (Average 299)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 95
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 124 124 020 Pre-fail Offline - 33
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 2784
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 95
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 180
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 180
194 Temperature_Celsius 0x0002 240 240 000 Old_age Always - 25 (Lifetime Min/Max 20/51)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 147 hours (6 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 be 18 d9 05 Error: ICRC, ABRT 1 sectors at LBA = 0x05d918be = 98113726
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d8 40 7f 18 d9 40 00 00:14:28.462 READ DMA EXT
25 d8 40 3f 18 d9 40 00 00:14:28.462 READ DMA EXT
25 d8 40 ff 17 d9 40 00 00:14:28.461 READ DMA EXT
25 d8 40 bf 17 d9 40 00 00:14:28.461 READ DMA EXT
25 d8 40 7f 17 d9 40 00 00:14:28.461 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Социальные закладки